Zeta-20Desktop optical profilometer is a non-contact 3D surface topography measurement system. The system adoptsZDot ™Technology andMulti-ModeA multi-mode optical system can measure various types of samples, including transparent and opaque, low to high reflectivity, smooth to rough textures, and step heights ranging from nanometers to millimeters.

Zeta-20The configuration is flexible and easy to use, and it integrates six different optical measurement techniques.ZDot ™ measureQuantity mode can simultaneously collect high-resolution data3DData andTrue Color（True color) infinite focal image. other3DMeasurement techniques include white light interferometryNomarskiInterference contrast microscope and shear interferometry measurement.ZDotAlternatively, an integrated broadband reflectometer can be used to measure the thickness of thin films.Zeta-20It is also a high-end microscope that can be used for sample retesting or automatic defect detection.Zeta-20By providing comprehensive measurements of step height, roughness, and film thickness, as well as defect detection capabilities, it is suitable for research and production environments.